Advanced Terahertz Frequency-Domain Ellipsometry Instrumentation for In Situ and Ex Situ Applications

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ژورنال

عنوان ژورنال: IEEE Transactions on Terahertz Science and Technology

سال: 2018

ISSN: 2156-342X,2156-3446

DOI: 10.1109/tthz.2018.2814347